The JEM-2100 electron microscope provides solutions for a wide range of problems in the fields of materials, nanoelectronics, and biological sciences.

Based on MS Windows™ software, the JEM-2100 is intuitive and easy to use with external control functions including the optional SIRIUS™ remote control system. The advanced control system allows integration of STEM, EDS, and EELS.

The JEM-2100 features a high-stability goniometer stage specifically tuned for high tilt tomographic applications. The optional JEOL TEMography™ software system automatically acquires and registers images, automatically calculates the 3-D reconstruction, and provides 3-D visualization software to display and rotate the image on a variety of axes. An x/y piezo stage is an available option.

The JEM-2100 has three independent condenser lenses and produces the highest probe current for any given probe size, which allows for improved analytical and diffraction capabilities. The patented JEOL Alpha Selector™ allows a user the selection of a variety of illumination conditions, ranging from full convergent beam to parallel illumination. The standard incorporation of the objective mini lens means that Lorentz microscopy is a standard feature of this microscope. A high contrast aperture is available for any choice of polepiece, allowing high contrast imaging and simultaneous EDS.